SINS Beamline

Technical Description:

Surface, Interface, and Nanostructure Science Beam Line (SINS)

Photoemission Spectroscopy (PES)
Photoemission Electron Microscopy (PEEM)
X-Ray Photoelectron Diffraction (XPD)
Soft X-Ray Magnetic Circular Dichroism (SXMCD)
Absorption Spectroscopy (NEXAFS, XANES)


Technical Data:

Radiation source:    Dipol
Energy range:   50 ... 1400 eV
Photon flux on sample:   ca. 1011 Ph / s / 100 mA
Resolution on sample:   > 5000
Beam power:   approx. 2 kW (before mirror 1)
Monochromator:   Dragon monochromator (FMB) 4 exchangeable Si–gratings
Mirrors:   2 focussing mirrors with bending systems (IRELEC) Refocussing mirror (IRELEC)
Beam diagnostics:   Beam position monitors
Intensity monitor
Fluorescence monitors
Polarization monitor
Beam profile monitors


Customer & Period:

   Singapore Synchrotron Light Source (SSLS)
Period of Implementation:
  April 2001 to July 2002
September 8, 2022
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