SINS Beamline
Technical Description:
Surface, Interface, and Nanostructure Science Beam Line (SINS)
Photoemission Spectroscopy (PES)
Photoemission Electron Microscopy (PEEM)
X-Ray Photoelectron Diffraction (XPD)
Soft X-Ray Magnetic Circular Dichroism (SXMCD)
Absorption Spectroscopy (NEXAFS, XANES)
Technical Data:
| Radiation source: | Dipol | |
| Energy range: | 50 ... 1400 eV | |
| Photon flux on sample: | ca. 1011 Ph / s / 100 mA | |
| Resolution on sample: | > 5000 | |
| Beam power: | approx. 2 kW (before mirror 1) | |
| Monochromator: | Dragon monochromator (FMB) 4 exchangeable Si–gratings | |
| Mirrors: | 2 focussing mirrors with bending systems (IRELEC) Refocussing mirror (IRELEC) | |
| Beam diagnostics: | Beam position monitors Intensity monitor Fluorescence monitors Polarization monitor Beam profile monitors |
Customer & Period:
| Customer: |
Singapore Synchrotron Light Source (SSLS) | |
| Period of Implementation: |
April 2001 to July 2002 |
JUX_PORTFOLIO_PRO_DATE
September 8, 2022
JUX_PORTFOLIO_PRO_CATEGORY
ROOT
JUX_PORTFOLIO_PRO_TAGS
